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Chuangxin Instruments Co., Ltd

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     Chuangxin Instruments Co., Ltd

    China/Guangdong

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    IEC jointed finger probe B
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    Product:
    Brand: CX 
    Price: Negotiable 
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    Delivery time: From the date of payment from the buyer within 3days of delivery
    update time: 2024-10-20 01:00  Valid to:2024-12-09 [Expired]
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      IEC61032 Test probe B, jointed finger probe

    Conforms to:

     This is the "international" test probe B required by most IEC, EN and CSA standards, in addition to many UL standards. The Jointed Finger Test is a high-precision probe built in exact accordance with IEC standards such as IEC 60950, IEC 61010, and IEC 61032 and is also used for CSA and UL standards.

     Notes:
    Both joints shall permit movement in the same plane and the same direction through an angle of 90o with a 0o to +10o tolerance.

     

    Technical Parameters:

    Kunrled finger diameter 12mm                                   
    Knurled Finger length 80mm
    Baffle plate diameter 50mm
    Baffle plate length 100mm
    Baffle thickness 20mm

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